Search GDR Data
Showing results 1 - 1 of 1.
Show
results per page.
Order by:
Available Now:
Technologies
Featured Projects
Topics
Data Type
SiC Diode Test Data
Fabricated SiC diodes are tested in the temperature range of 300 degrees C to 600 degrees C.
Gilbert, G. Sandia National Laboratories
Aug 01, 2014
1 Resources
0 Stars
Publicly accessible
1 Resources
0 Stars
Publicly accessible